JEOL JXA-8230 Electron Microprobe
This new (2012) instrument provides micron-scale quantitative chemical analysis of solid materials and compositional imaging based on X-rays, backscattered electrons, and full-color cathodoluminenscence (CL).
Our “workhorse” powder X-ray diffractometer can readily identify minerals in powdered form, including mixtures of phases.
Scanning Electron Microscope
This SEM is useful for routine electron imaging of solid materials and for monochrome cathodoluminescence (CL) studies of minerals such as zircons.